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Magazine Name : Mrs Bulletin

Year : 2003 Volume number : 28 Issue: 02

Single-Event Upsets In Microelectronics (Article)
Subject: Single Bottleneck Node
Author: H.H.K. Tang     
page:      107 - 110
Single-Event Upsets In Microelectronics:Fundamental Physics And Issues (Article)
Subject: Fundamental Algorithms
Author: H.H.K. Tang     
page:      111 - 116
Impact Of Single-Event Upsets In Deep-Submicronsilicon Technology (Article)
Subject: Probability
Author: R. Baumann     
page:      117 - 120
Relations Between Basic Nuclear Data And Single-Event Upsets Phenomena (Article)
Subject: Relationship
Author: J. Biomgren     
page:      121 - 125
Circuit Responses To Radiation-Induced Upsets (Article)
Subject: Response
Author: K. Bernstein     
page:      126 - 130
Total Ionizing Dose And Displacement-Damage Effects In Microelectronics (Article)
Subject: Displacement
Author: C.C. Foster.     
page:      136 - 140
Cosmic-Ray Neutrons On The Ground And In The Atmosphere (Article)
Subject: Atmospheric Boundary Layer
Author: P. Goldhagen     
page:      161 - 135